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Place of Origin : Shenzhen China
Brand Name : Julixing
Certification : CNAS Test Report
Model Number : LX-60335K
Types of companies : China Wholesale
Incoterms : CFR
Transportation : DHL Express
Product Type : Testing Equipment
MOQ : 1 set
Price : Contacts us
Packaging Details : Standard packing
Delivery Time : 7-15 Days
Payment Terms : T/T,Western Union
Supply Ability : 500 Set per month
Meets IEC 60335. Accessibility probes are used to test the size of openings to ensure that fingers and objects do not have access to hazardous parts in equipment and machinery.
SPECIFICATIONS
1. Jointed Finger Probe: Precision probe which follows IEC specifications and meets the newest requirements. The design features a plan simulator to prevent misuse and a restricted joint movement which simulates human finger movement. This model meets CSA, IEC, UL and other industry requirements.
2. Test Pin Probe: A quality probe used to test for accessibility of small objects manufactured of rugged Delrin with a stainless steel tip, it is machined with precision to meet industry standards. Meets CSA, IEC, UL and other industry requirements.
3. Test Pin Probe 50mm: It is designed to perform tests in large and small scale products. The Test Pin Probe 50mm was design to attend your necessities of accessibility testing. The Test Pin Probe 50mm is used to test for accessibility of small objects and meets IEC, CSA, and UL requirements. Same as Test Pin Probe 15mm, except the metal tip is 50mm long. Tip is 4mm. Meet IEC 61032.
4. Unjointed Finger Probe: Identical to the Jointed Finger Probe except that is is rigid. Used for forceful insertion where the flexibility of the Jointed Finger Probe would be a hindrance. The handle is designed with a screw tap for use with a force gauge. Meets CSA, IEC, UL and other industry.
5. Test Thorn Probe: It is designed to perform tests in large and small scale products. It was design to attend your necessities of accessibility testing. It is used for testing appliances according to IEC, CSA and UL Standards. It is used to verify protection from hazardous hot or glowing parts.
Shenzhen Julixing Instruments Co., Ltd. are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
																																																															
																																																															If you require testing equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
																																																															
																																																															
																																																															We would appreciate your comments on the layout design, presentation or other aspects of our website.
																																																															
																																																															Website: http://www.china-item.com
Contacts: Eason Wang
E-mail: sales@china-item.com
TEL: +86-755-33168386
FAX: +86-755-61605199
Phone: +86-13751010017
SKYPE: carlisle.wyk
Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
ZIP Code: 518101
Website: http://www.china-item.com/
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| SASO/IEC 60335, EN 60335, AS/NZS/EN/IEC 60335, IRAM 2092, IEC 60335 Test Probe Kit Images | 
 Finger Probe Test of IEC 60335-2-14: 2006 +A1:2008+A2:2012
                                                                                    
                        
                        
                        
                                                            Finger Probe Test of IEC 60335-2-14: 2006 +A1:2008+A2:2012
                                                    
                        
                     IEC 60335 Test Probe B with 125mm * 80mm Baffle Plate
                                                                                    
                        
                        
                        
                                                            IEC 60335 Test Probe B with 125mm * 80mm Baffle Plate
                                                    
                        
                     UL1205 / IEC60475 / IEC60335 Figure 7 Test Finger Nail of Insulating Material
                                                                                    
                        
                        
                        
                                                            UL1205 / IEC60475 / IEC60335 Figure 7 Test Finger Nail of Insulating Material
                                                    
                        
                     UL 1205 / IEC 60475 / IEC 60335-1 Figure 7 - Test Finger Nail with 30N Force
                                                                                    
                        
                        
                        
                                                            UL 1205 / IEC 60475 / IEC 60335-1 Figure 7 - Test Finger Nail with 30N Force
                                                    
                        
                     UL 1205 - Test Finger Nail with 30N Force Gauges
                                                                                    
                        
                        
                        
                                                            UL 1205 - Test Finger Nail with 30N Force Gauges
                                                    
                        
                     SASO/IEC 60335-1 / NEN-EN-IEC 60745-1:2006 Figure 7 - Test Fingernail
                                                                                    
                        
                        
                        
                                                            SASO/IEC 60335-1 / NEN-EN-IEC 60745-1:2006 Figure 7 - Test Fingernail
                                                    
                        
                     IEC60335 Test Finger Nail Probe of 50N Thrust
                                                                                    
                        
                        
                        
                                                            IEC60335 Test Finger Nail Probe of 50N Thrust
                                                    
                        
                     IEC60335 Standard Appliances Test Vessel and Pans
                                                                                    
                        
                        
                        
                                                            IEC60335 Standard Appliances Test Vessel and Pans
                                                    
                        
                     IEC60335-2-30 75mm Test Sphere Probe of Sphere is Hardened Steel
                                                                                    
                        
                        
                        
                                                            IEC60335-2-30 75mm Test Sphere Probe of Sphere is Hardened Steel
                                                    
                        
                     Inclined Plane Device
                                                                                    
                        
                        
                        
                                                            Inclined Plane Device